Polynomial complexity algorithms for increasing the testability of digital circuits by testing-module insertion

DOI10.1109/12.102824zbMATH Open1395.94410OpenAlexW2164651157MaRDI QIDQ5375422FDOQ5375422

Authors: Irith Pomeranz, Zvi Kohavi 

Publication date: 14 September 2018

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.102824

Mathematics Subject Classification ID

Analysis of algorithms and problem complexity (68Q25) Fault detection; testing in circuits and networks (94C12)

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