Finite element analysis of resonant properties of silicon nanowires with consideration of surface effects
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Publication:539299
DOI10.1007/S00707-010-0388-4zbMATH Open1398.74140OpenAlexW1989825461MaRDI QIDQ539299FDOQ539299
Authors: Yankun Feng, Biao Wang, Yulan Liu 
Publication date: 27 May 2011
Published in: Acta Mechanica (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00707-010-0388-4
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- A finite element formulation for nanoscale resonant mass sensing using the surface Cauchy-Born model
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- A review on the application of modified continuum models in modeling and simulation of nanostructures
- Selecting the optimum engineering model for the frequency response of FCC nanowire resonators
- Finite element analysis of resonant properties of silicon nanowires
- The surface effects on solid and hollow nanowires under diametral loading
- Effects of high-order surface stress on buckling and resonance behavior of nanowires
- Surface effects of surface nanowires on the dynamic behavior of a quartz crystal resonator under the thickness-shear mode vibrations
- Modeling of surface stress effects on bending behavior of nanowires: Incremental deformation theory
- Surface effects on free vibration of piezoelectric functionally graded nanobeams using nonlocal elasticity
- Eigenfrequencies and quality factors of nanofilm resonators with dissipative surface stress effects
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