Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in
From MaRDI portal
Publication:5408760
DOI10.1137/110824516zbMath1285.68067OpenAlexW2024334120MaRDI QIDQ5408760
Ilya Volkovich, Amir Shpilka, Partha Mukhopadhyay, Zohar S. Karnin
Publication date: 11 April 2014
Published in: SIAM Journal on Computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/110824516
Lua error in Module:PublicationMSCList at line 37: attempt to index local 'msc_result' (a nil value).
Related Items (5)
Subexponential size hitting sets for bounded depth multilinear formulas ⋮ Unnamed Item ⋮ Deterministic polynomial identity tests for multilinear bounded-read formulae ⋮ Read-once polynomial identity testing ⋮ Depth-4 Identity Testing and Noether’s Normalization Lemma
This page was built for publication: Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in
