Blackbox identity testing for bounded top fanin depth-3 circuits
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Publication:5419113
DOI10.1145/1993636.1993694zbMath1288.68138MaRDI QIDQ5419113
Publication date: 5 June 2014
Published in: Proceedings of the forty-third annual ACM symposium on Theory of computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1145/1993636.1993694
blackbox; derandomization; polynomial identity testing; fan-in; depth-3 circuits; Chinese remaindering
68Q25: Analysis of algorithms and problem complexity
68W30: Symbolic computation and algebraic computation
94C12: Fault detection; testing in circuits and networks
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