Publication:5440514

zbMath1132.82020MaRDI QIDQ5440514

Wei Liu, Yi-Rang Yuan

Publication date: 5 February 2008

zbMATH Keywords

finite difference scheme; error estimate; local refinement; semiconductor device

Mathematics Subject Classification ID

65M06: Finite difference methods for initial value and initial-boundary value problems involving PDEs

65M12: Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs

82D37: Statistical mechanics of semiconductors

65M15: Error bounds for initial value and initial-boundary value problems involving PDEs

65M50: Mesh generation, refinement, and adaptive methods for the numerical solution of initial value and initial-boundary value problems involving PDEs