An integrated approach for process monitoring using wavelet analysis and competitive neural network
From MaRDI portal
Publication:5444457
DOI10.1080/00207540500442393zbMath1128.90466OpenAlexW2155862317MaRDI QIDQ5444457
Chih-Hsuan Wang, Hairong Qi, Way Kuo
Publication date: 25 February 2008
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00207540500442393
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Cites Work
- Adapting to Unknown Smoothness via Wavelet Shrinkage
- A massively parallel architecture for a self-organizing neural pattern recognition machine
- X-bar andRcontrol chart interpretation using neural computing
- Control chart pattern recognition using learning vector quantization networks
- A two-stage neural network approach for process variance change detection and classification
- An integrated neural network approach for simultaneous monitoring of process mean and variance shifts a comparative study
- The determination of mean and/or variance shifts with artificial neural networks
- De-noising by soft-thresholding