EM algorithm for comparing two binary diagnostic tests when not all the patients are verified

DOI10.1080/10629360600938102zbMath1367.62300MaRDI QIDQ5457921

J. A. Roldán Nofuentes, Juan de Dios Luna del Castillo

Publication date: 10 April 2008

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/10629360600938102

zbMATH Keywords

sensitivity; partial verification; specificity; verification bias; predictive values; EM and SEM algorithms

Mathematics Subject Classification ID

62P10: Applications of statistics to biology and medical sciences; meta analysis

62F03: Parametric hypothesis testing

Related Items

EM and SEM algorithms to compare the weighted kappa coefficients of two diagnostic tests in the presence of partial verification and discrete covariates, Asymptotic hypothesis test to simultaneously compare the weighted kappa coefficients of multiple binary diagnostic tests in the presence of ignorable missing data, Computational methods for comparing two binary diagnostic tests in the presence of partial verification of disease, Determining sample size to evaluate and compare the accuracy of binary diagnostic tests in the presence of partial disease verification, Comparison of the accuracy of multiple binary tests in the presence of partial disease verification, Computational methods to simultaneously compare the predictive values of two diagnostic tests with missing data: EM-SEM algorithms and multiple imputation

Cites Work

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• Comparing Accuracies of Two Screening Tests in a Two-Phase Study for Dementia
• Maximum likelihood estimators of sensitivity and specificity corrected for verification bias