Wavelet-based SPC procedure for complicated functional data

DOI10.1080/00207540500222647zbMath1095.62136MaRDI QIDQ5478830

Myong K. Jeong, Ni Wang, Jye-Chyi Lu

Publication date: 13 July 2006

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540500222647

zbMATH Keywords

Process control; Data reduction; Quality improvement; Control chart; Thresholding test

Mathematics Subject Classification ID

62P30: Applications of statistics in engineering and industry; control charts

65T60: Numerical methods for wavelets

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Cites Work

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