On the determination of an inhomogeneity in an elliptic equation

DOI10.1080/00036810500499926zbMATH Open1101.35078OpenAlexW2042483274MaRDI QIDQ5481698FDOQ5481698

Authors: Mourad Choulli 

Publication date: 10 August 2006

Published in: Applicable Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00036810500499926

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zbMATH Keywords

boundary measurementsGateaux derivativemetal-to-semiconductor contact resistivity of electronic devices

Mathematics Subject Classification ID

Boundary value problems for second-order elliptic equations (35J25) Inverse problems for PDEs (35R30)

Cites Work

• Title not available (Why is that?)
• Recovery of the support of a source term in an elliptic differential equation
• Identification problems in potential theory
• Identification of the Conductivity Coefficient in an Elliptic Equation
• Local stability estimate for an inverse conductivity problem

Cited In (4)

• Unique determination of inhomogeneity in an elliptic equation
• Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach
• The problem of detecting corrosion by an electric measurement revisited
• Reconstruction and stability analysis of potential appearing in time‐fractional subdiffusion

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