Fault Testing and Diagnosis in Combinational Digital Circuits

DOI10.1109/TC.1968.229394zbMATH Open0162.48203MaRDI QIDQ5546352FDOQ5546352

Authors: William H. Kautz 

Publication date: 1968

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

zbMATH Keywords

numerical analysis

Cited In (3)

• Optimal attribute sets for identifications and diagnoses
• Semi-tensor product-based algebra-logic mixed representation and fault diagnosis for a class of gate networks
• An improved algorithm for finding diagnostic taxonomic descriptions

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