Life Testing and Reliability Estimation for the Two Parameter Exponential Distribution
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Publication:5572028
DOI10.2307/2283645zbMATH Open0181.45403OpenAlexW4233079642MaRDI QIDQ5572028FDOQ5572028
Authors: S. D. Varde 
Publication date: 1969
Full work available at URL: https://doi.org/10.2307/2283645
Cited In (14)
- Shrinkage and modification techniques in estimation of variance and the related problems: A review
- Bayesian inference in truncated and censored exponential distribution and reliability estimation
- Classical and bayesian estimation of exponential reliability under time censoring with replacement
- Ordered and censored lifetime data in reliability: an illustrative review
- Bayes and stein estimation under asymmetric loss functions:a numerical risk comparison
- Exact simultaneous location-scale tests for two shifted exponential samples
- An optimal Bayesian sampling plan for two-parameter exponential distribution under type-I hybrid censoring
- Bayes estimation for exponential distributions with common location parameter and applications to multi-state reliability models
- Two-sample Bayesian prediction for sequential order statistics from exponential distribution based on multiply Type-II censored samples
- On the estimation of \(Pr\{ Y<X\}\) for the two-parameter exponential distribution
- A Bayesian method on adaptive preventive maintenance problem.
- Bayesian estimation for shifted exponential distributions
- Empirical Bayes approach to statistical estimation in the Paretian law
- Bayesian estimation and prediction with multiply type-II censored samples of sequential order statistics from one- and two-parameter exponential distributions
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