Exact distribution functions of test length for sequential processors with discrete input data

DOI10.1109/TIT.1963.1057834zbMATH Open0202.49702MaRDI QIDQ5601211FDOQ5601211

Authors: John G. Proakis 

Publication date: 1963

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Mathematics Subject Classification ID

Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Sequential statistical analysis (62L10)

Cited In (1)

• Truncated sequential CFAR detectors using weighted sign and weighted conditional sign tests

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