On the Extraction of Pattern Features from Continuous Measurements

DOI10.1109/TSSC.1970.300284MaRDI QIDQ5656417zbMATH OpenOpenAlexFDO

Authors A. Caprihan, Rui J. P. de Figueiredo

Publication date 1970

Published in IEEE Transactions on Systems Science and Cybernetics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tssc.1970.300284

Mathematics Subject Classification ID

Applications of renewal theory (reliability, demand theory, etc.) (60K10) Pattern recognition, speech recognition (68T10)

Cited in

(3)

• Bayesian discriminant approach to input signal selection in parameter estimation problems
• On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns
• On feature extraction in pattern recognition†

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