On the Extraction of Pattern Features from Continuous Measurements

DOI10.1109/TSSC.1970.300284zbMATH Open0244.68049OpenAlexW1983585417MaRDI QIDQ5656417FDOQ5656417

Authors: A. Caprihan, Rui J. P. de Figueiredo 

Publication date: 1970

Published in: IEEE Transactions on Systems Science and Cybernetics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tssc.1970.300284

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10) Applications of renewal theory (reliability, demand theory, etc.) (60K10)

Cited In (3)

• On feature extraction in pattern recognition†
• Bayesian discriminant approach to input signal selection in parameter estimation problems
• On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns

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