Harnessing the transient signals in atomic force microscopy
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Publication:5704771
DOI10.1002/rnc.1025zbMath1090.93034WikidataQ59561579 ScholiaQ59561579MaRDI QIDQ5704771
Deepak R. Sahoo, Abu Sebastian, Murti V. Salapaka
Publication date: 15 November 2005
Published in: International Journal of Robust and Nonlinear Control (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/rnc.1025
93E11: Filtering in stochastic control theory
92C55: Biomedical imaging and signal processing
93C95: Application models in control theory
81V99: Applications of quantum theory to specific physical systems
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