Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution
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Publication:5751820
DOI<1::AID-NAV3220380103>3.0.CO;2-3 10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3zbMath0719.62516MaRDI QIDQ5751820
Publication date: 1991
Full work available at URL: https://doi.org/10.1002/1520-6750(199102)38:1<1::aid-nav3220380103>3.0.co;2-3
62N05: Reliability and life testing
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