Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution

DOI<link itemprop=identifier href="https://doi.org/10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3" /><1::AID-NAV3220380103>3.0.CO;2-3 10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3zbMath0719.62516OpenAlexW1969727327MaRDI QIDQ5751820

Bong-Jin Yum, Sun-Keun Seo

Publication date: 1991

Full work available at URL: https://doi.org/10.1002/1520-6750(199102)38:1<1::aid-nav3220380103>3.0.co;2-3

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (6)

Optimal design of accelerated life tests under modified stress loading methods ⋮ Optimal design of inspection times for interval censoring ⋮ The step-stress tampered failure rate model under interval monitoring ⋮ Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals ⋮ Bayesian analysis for step‐stress accelerated life testing under progressive interval censoring ⋮ Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution

Cites Work

• Linear Statistical Inference and its Applications
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