Reliability analysis for degradation and shock process based on truncated normal distribution

DOI10.1080/03610918.2020.1740264OpenAlexW3012146448MaRDI QIDQ5867461FDOQ5867461

Authors: Huiling Zheng, Houbao Xu 

Publication date: 14 September 2022

Published in: Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610918.2020.1740264

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zbMATH Keywords

reliabilityshockdegradationtruncated normal distribution

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Bayesian Measures of Model Complexity and Fit
• A table of normal integrals
• Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution
• Wiener processes with random effects for degradation data
• Modelling accelerated degradation data using Wiener diffusion with a time scale transformation
• Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods
• Objective Bayesian analysis accelerated degradation test based on Wiener process models
• A Wiener process model with truncated normal distribution for reliability analysis
• A reliability system under cumulative shocks governed by a BMAP
• Reliability modeling for mutually dependent competing failure processes due to degradation and random shocks
• Objective Bayesian analysis for the accelerated degradation model based on the inverse Gaussian process
• The inverse Gaussian process with a skew-normal distribution as a degradation model
• WCF approach of reliability assessment for solid state power controller with accelerate degradation data

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