Reliability analysis for degradation and shock process based on truncated normal distribution

DOI10.1080/03610918.2020.1740264MaRDI QIDQ5867461zbMATH OpenOpenAlexFDO

Authors Huiling Zheng, Houbao Xu

Publication date 14 September 2022

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2020.1740264

zbMATH Keywords

reliabilityshockdegradationtruncated normal distribution

Mathematics Subject Classification ID

Statistics (62-XX)

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Cites work

• A Wiener process model with truncated normal distribution for reliability analysis
• A reliability system under cumulative shocks governed by a BMAP
• A table of normal integrals
• Bayesian Measures of Model Complexity and Fit
• Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods
• Modelling accelerated degradation data using Wiener diffusion with a time scale transformation
• Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution
• Objective Bayesian analysis accelerated degradation test based on Wiener process models
• Objective Bayesian analysis for the accelerated degradation model based on the inverse Gaussian process
• Reliability modeling for mutually dependent competing failure processes due to degradation and random shocks
• The inverse Gaussian process with a skew-normal distribution as a degradation model
• WCF approach of reliability assessment for solid state power controller with accelerate degradation data
• Wiener processes with random effects for degradation data

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