Representing the mean residual life in terms of the failure rate

DOI10.1016/S0895-7177(03)90038-0zbMath1045.62104arXivmath/0411297MaRDI QIDQ597410

Ramesh C. Gupta, David M. Bradley

Publication date: 6 August 2004

Published in: Mathematical and Computer Modelling (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/math/0411297

zbMATH Keywords

gamma distribution; Pearson family of distributions; Maxwell distribution; Gaussian probability function; Ultimately increasing failure rate

Mathematics Subject Classification ID

62E10: Characterization and structure theory of statistical distributions

62N05: Reliability and life testing

Cites Work

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• Characterization of beta, binomial, and Poisson distributions
• Analysis for the Linear Failure-Rate Life-Testing Distribution
• Tests for the mean residual life
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• The multivariate hazard gradient and moments of the truncated multinormal distribution
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