A <scp>latent‐factor self‐exciting</scp> point process for software failures

DOI10.1002/nav.22107zbMath1525.90164OpenAlexW4361270005MaRDI QIDQ6057025

Joshua Landon, Refik Soyer, Atilla Ay, Fabrizio Ruggeri

Publication date: 25 October 2023

Published in: Naval Research Logistics (NRL) (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.22107

zbMATH Keywords

Markov chain Monte Carloreliability growthsoftware testingimperfect debuggingself-exciting point process

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Cites Work

• Bayesian inference for Hawkes processes
• Statistical methods in software engineering. Reliability and risk
• Imperfect debugging in software reliability: a Bayesian approach
• A Markov modulated Poisson model for software reliability
• A cluster process representation of a self-exciting process
• Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures
• Unification of Software Reliability Models by Self-Exciting Point Processes
• Birth-Death and Bug Counting
• Spectra of some self-exciting and mutually exciting point processes
• Software reliability modelling and prediction with hidden Markov chains
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