Fault classification for high‐dimensional data streams: A directional diagnostic framework based on multiple hypothesis testing
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Cites work
- Covariate-assisted ranking and screening for large-scale two-sample inference
- Efficient scalable schemes for monitoring a large number of data streams
- Estimating the Null and the Proportion of Nonnull Effects in Large-Scale Multiple Comparisons
- scientific article; zbMATH DE number 4001209 (Why is no real title available?)
- Large-Scale Simultaneous Hypothesis Testing
- Multiple testing of composite null hypotheses in heteroscedastic models
- Multivariate statistical process control using Lasso
- Nonparametric Function Estimation for Clustered Data When the Predictor is Measured without/with Error
- On optimal kernel choice for deconvolution
- Optimal false discovery rate control for dependent data
- Oracle and Adaptive Compound Decision Rules for False Discovery Rate Control
- Practical bandwidth selection in deconvolution kernel density estimation
- Signal classification for the integrative analysis of multiple sequences of large-scale multiple tests
- Simultaneous Testing of Grouped Hypotheses: Finding Needles in Multiple Haystacks
- Symmetric directional false discovery rate control
Cited in
(11)- Online monitoring of high-dimensional binary data streams with application to extreme weather surveillance
- Robust online detection in serially correlated directed network
- An adaptive multivariate EWMA control chart for monitoring missing data
- Reliable Post-Signal Fault Diagnosis for Correlated High-Dimensional Data Streams
- Statistical Process Monitoring from Industry 2.0 to Industry 4.0: Insights into Research and Practice
- Directional false discovery rate control in large-scale multiple comparisons
- Enhancing operational decision-making in fault diagnosis for high-dimensional data streams with auxiliary information
- Optimal control of directional false discovery rates in large-scale testing
- A robust diagnostic approach in mean shifts for multivariate statistical process control
- Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances
- Multiple cumulative sum control charts for monitoring and diagnostics of correlated quality variables of different types with individual observations
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