Bayesian and non-Bayesian inference for a general family of distributions based on simple step-stress life test using TRV model under type II censoring

DOI10.1080/07474946.2023.2224401MaRDI QIDQ6185925zbMATH OpenOpenAlexFDO

Authors Subhankar Dutta, Farha Sultana, Suchandan Kayal

Publication date 9 January 2024

Published in Sequential Analysis (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/2106.14377

zbMATH Keywords

Bayes estimateHPD credible intervalLehmann family of distributionsmaximum likelihood estimateMCMC methodsimple step-stress life testTRV model

Mathematics Subject Classification ID

Point estimation (62F10) Bayesian inference (62F15) Estimation in survival analysis and censored data (62N02)

Abstract: In this paper, we focus on the parametric inference based on the Tampered Random Variable (TRV) model for simple step-stress life testing (SSLT) using Type-II censored data. The baseline lifetime of the experimental units, under normal stress conditions, follows the Gumbel Type-II distribution with $alpha$ and $lambda$ being the shape and scale parameters, respectively. Maximum likelihood estimator (MLE) and Bayes estimator of the model parameters are derived based on Type-II censored samples. We obtain asymptotic intervals of the unknown parameters using the observed Fisher information matrix. Bayes estimators are obtained using Markov Chain Monte Carlo (MCMC) method under squared error loss and LINEX loss functions. We also construct highest posterior density (HPD) intervals of the unknown model parameters. Extensive simulation studies are performed to investigate the finite sample properties of the proposed estimators. Three different optimality criteria have been considered to determine the optimal censoring plans. Finally, the methods are illustrated with the analysis of two real data sets.

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Cited in

(2)

• Bayesian reliability estimation for Copoun distribution using type II censored step-stress accelerated life tests: methods and applications
• Robust divergence-based tests of hypotheses for simple step-stress accelerated life-testing under gamma lifetime distributions

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