Determination of the optimal accelerated burn-in time under Arrhenius-log normal distribution assumption

DOI10.1016/J.APM.2011.02.022zbMath1221.62138OpenAlexW2033441349MaRDI QIDQ639178

Pei-Hsi Lee, Yang-Cheng Lin, Chau-Chen Torng

Publication date: 18 September 2011

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2011.02.022

zbMATH Keywords

genetic algorithmaccelerated burn-in testLCD moduleTFT

Mathematics Subject Classification ID

Applications of mathematical programming (90C90) Approximation methods and heuristics in mathematical programming (90C59) Reliability and life testing (62N05)

Related Items (1)

Local linear smoothing to estimate accelerated lifetime model with censoring and truncation

Cites Work

• Theory of genetic algorithms. II: Models for genetic operators over the string-tensor representation of populations and convergence to global optima for arbitrary fitness function under scaling
• Optimal burn-in with random minimal repair cost
• On the Possibility of Improving the Mean Useful Life of Items by Eliminating Those with Short Lives
• Reliability Enhancement Through Optimal Burn-In
• Accelerated Testing
• Cost-Optimized Burn-In Duration for Repairable Electronic Systems
• Comparisons of renewable warranties
• Optimal burn-in decision for products with an unimodal failure rate function
• Theory of genetic algorithms

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