Retraction Note: Capacitance pin defect detection based on deep learning
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Publication:6497017
DOI10.1007/S10878-024-01130-0MaRDI QIDQ6497017FDOQ6497017
Authors: Cheng Cheng, Ning Dai, Jie Huang, Tao Tang, Longlong Liu
Publication date: 6 May 2024
Published in: Journal of Combinatorial Optimization (Search for Journal in Brave)
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