One- and two-sided monitoring schemes for BINARCH(1) processes

DOI10.1002/ASMB.2658MaRDI QIDQ6580703zbMATH OpenFDO

Authors Maria Anastasopoulou, Athanasios C. Rakitzis

Publication date 29 July 2024

Published in Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

overdispersionaverage run lengthstatistical process control\(s\)-EWMA chartrounding operationBINARCH(1) modelEurozone inflation data

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• A binomial CUSUM chart for detecting large shifts in fraction nonconforming
• A binomial integer-valued ARCH model
• An ARL-unbiased thinning-based EWMA chart to monitor counts
• An approach to the probability distribution of cusum run length
• BINOMIAL AUTOREGRESSIVE PROCESSES WITH DENSITY-DEPENDENT THINNING
• CONTINUOUS INSPECTION SCHEMES
• Combined CUSUM–Shewhart Schemes for Binomial Data
• Control charts for monitoring correlated counts with a finite range
• Detecting mean increases in Poisson INAR(1) processes with EWMA control charts
• Diagnosing and modeling extra-binomial variation for time-dependent counts
• Monitoring correlated processes with binomial marginals
• Monitoring observations generated from a binomial distribution using modified exponentially weighted moving average control chart
• On ARL-unbiased c-charts for INAR(1) Poisson counts
• Parameter estimation for binomial \(\mathrm{AR}(1)\) models with applications in finance and industry
• Sample size and the binomial CUSUM control chart: The case of 100\% inspection
• Statistical quality control. A modern introduction

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