One- and two-sided monitoring schemes for BINARCH(1) processes
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Publication:6580703
DOI10.1002/ASMB.2658MaRDI QIDQ6580703FDOQ6580703
Authors: Maria Anastasopoulou, Athanasios C. Rakitzis
Publication date: 29 July 2024
Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)
overdispersionaverage run lengthstatistical process control\(s\)-EWMA chartrounding operationBINARCH(1) modelEurozone inflation data
Cites Work
- Statistical quality control. A modern introduction
- CONTINUOUS INSPECTION SCHEMES
- An approach to the probability distribution of cusum run length
- Parameter estimation for binomial \(\mathrm{AR}(1)\) models with applications in finance and industry
- BINOMIAL AUTOREGRESSIVE PROCESSES WITH DENSITY-DEPENDENT THINNING
- Monitoring correlated processes with binomial marginals
- Detecting mean increases in Poisson INAR(1) processes with EWMA control charts
- On ARL-unbiased c-charts for INAR(1) Poisson counts
- A binomial CUSUM chart for detecting large shifts in fraction nonconforming
- Monitoring observations generated from a binomial distribution using modified exponentially weighted moving average control chart
- Sample size and the binomial CUSUM control chart: The case of 100\% inspection
- Combined CUSUM–Shewhart Schemes for Binomial Data
- Control charts for monitoring correlated counts with a finite range
- An ARL-unbiased thinning-based EWMA chart to monitor counts
- A binomial integer-valued ARCH model
- Diagnosing and modeling extra-binomial variation for time-dependent counts
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