A double sampling plan for truncated life tests under two-parameter Lindley distribution
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Publication:6601596
Cites work
- scientific article; zbMATH DE number 3140082 (Why is no real title available?)
- scientific article; zbMATH DE number 1862734 (Why is no real title available?)
- A modified variables repetitive group sampling plan with the consideration of preceding lots information
- A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution
- Acceptance Sampling in Quality Control
- An adjustable inspection scheme for lot sentencing based on one-sided capability indices
- An efficient inspection scheme for variables based on Taguchi capability index
- Double acceptance sampling plan for time-truncated life tests based on half normal distribution
- Lindley distribution and its application
- Optimal Bayesian sampling plan for censored competing risks data
- Optimal decision-theoretic sampling plan for two exponential distributions under joint censoring scheme
- Standardized lifetime-capability and warranty-return-rate-based suppliers qualification and selection with accelerated Weibull-life type II testing data
- Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions
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