A double sampling plan for truncated life tests under two-parameter Lindley distribution

DOI10.1007/S10479-024-05955-0MaRDI QIDQ6601596FDOQ6601596

Chien-Wei Wu, Nien-Yun Wu, Armin Darmawan

Publication date: 10 September 2024

Published in: Annals of Operations Research (Search for Journal in Brave)

zbMATH Keywords

failure rateacceptance samplinggraphical user interfacetruncation timeproduct lifetime

Mathematics Subject Classification ID

Statistics (62-XX) Applications of statistics (62Pxx) Survival analysis and censored data (62Nxx)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• An efficient inspection scheme for variables based on Taguchi capability index
• A modified variables repetitive group sampling plan with the consideration of preceding lots information
• Lindley distribution and its application
• Acceptance Sampling in Quality Control
• Variable-sampling plans based on lifetime-performance index under exponential distribution with censoring and its extensions
• Double acceptance sampling plan for time-truncated life tests based on half normal distribution
• A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution
• An adjustable inspection scheme for lot sentencing based on one-sided capability indices
• Standardized lifetime-capability and warranty-return-rate-based suppliers qualification and selection with accelerated Weibull-life type II testing data
• Optimal Bayesian sampling plan for censored competing risks data
• Optimal decision-theoretic sampling plan for two exponential distributions under joint censoring scheme

This page was built for publication: A double sampling plan for truncated life tests under two-parameter Lindley distribution

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6601596)