On the length of diagnostic tests for Boolean circuits
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Publication:679884
DOI10.1134/S0001434617090310zbMATH Open1425.94090OpenAlexW2767079856MaRDI QIDQ679884FDOQ679884
Authors: Nikolay P. Red'kin 
Publication date: 22 January 2018
Published in: Mathematical Notes (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1134/s0001434617090310
Recommendations
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- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
Cites Work
Cited In (35)
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- Tests with stuck-at and shift faults on circuit inputs
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- Estimations of the lengths of tests for logic gates in presence of many permissible faults
- On self-correcting logic circuits of unreliable gates with at most two inputs
- Title not available (Why is that?)
- On diagnostic test sets for local mirror reflections on circuit inputs
- On unit diagnostic tests for constant faults of the same type at outputs of functional elements
- Lower bounds for the lengths of single tests for Boolean circuits
- Diagnostic tests for local coalescences of variables in Boolean functions
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- Short complete diagnostic tests for circuits with one additional input in the standard basis
- Identity checking tests for circuits of functional elements in fan-in 2 bases
- Fault detection and diagnostic tests for logic gates
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
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- Short complete diagnostic tests for circuits with two additional inputs in some basis
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- Estimates for lengths of check and diagnostic tests of functional elements
- Short complete diagnostic tests for logic circuits in one infinite basis
- Title not available (Why is that?)
- On the number of minimal tests checking the block circuits of parity functions for closings
- Title not available (Why is that?)
- Diagnostics of inverse errors on inputs of disjunction scheme elements
- Diagnosis of constant faults in iteration-free circuits over monotone basis
- Diagnostic tests for discrete functions defined on rings
- Complete tests relative to displacing faults of inputs of circuits
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
- On effective methods for diagnosis of retaining faults in circuits
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- Circuits for disjunction admitting short unitary diagnostic tests
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
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