Analytical estimation of liquid film thickness in two-phase annular flow using electrical resistance measurement

DOI10.1016/J.APM.2011.09.069zbMATH Open1252.76011OpenAlexW2083599789MaRDI QIDQ693372FDOQ693372

Sin Kim, Kyung Youn Kim, Rong Li Wang, Bo An Lee, Jeong Seong Lee

Publication date: 7 December 2012

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2011.09.069

zbMATH Keywords

two-phase flowresistanceconformal mappingvoid fractionannular flowliquid film thickness

Mathematics Subject Classification ID

Thin fluid films (76A20)

Cites Work

• Analysis of thin film thickness determination in two-phase flow using a multifiber optical sensor
• The development of a flush-wire probe and calibration method for measuring liquid film thickness
• Conformal mapping and impedance tomography
• Film thickness variation about a T-junction
• Experimental study of two and three phase flows in large diameter inclined pipes
• A preliminary study of two-phase annular flow at microgravity: experimental data of film thickness
• Modelling of stratified gas-liquid two-phase flow in horizontal circular pipes

Cited In (1)

• Boundary element method to estimate the time-varying interfacial boundary in horizontal immiscible liquids flow using electrical resistance tomography

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