A formulation and comparison of two linear feature selection techniques applicable to statistical classification

DOI10.1016/0031-3203(84)90083-9zbMATH Open0557.62060OpenAlexW1983365877MaRDI QIDQ761746FDOQ761746

Authors: Dean M. Young, P. L. Odell 

Publication date: 1984

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0031-3203(84)90083-9

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zbMATH Keywords

principal componentsdimension reductiondecompositionmisclassificationsingular valuecomparison of linear feature selection techniquesprobability ofseparability measuressmallest Bayes- classification-region-preserving dimensionWilk's method

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Monte Carlo methods (65C05)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Statistical Properties of Error Estimators in Performance Assessment of Recognition Systems
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• Linear dimension reduction and Bayes classification
• Linear dimension reduction and Bayes classification with unknown population parameters
• Distance preserving linear feature selection
• Feature selection for best mean square approximation of class densities
• On minimizing the probability of misclassification for linear feature selection
• Feature combinations and the divergence criterion
• Linear feature selection with applications
• A model for dimension reduction in pattern recognition using continuous data
• Feature combinations and the bhattacharyya criterion

Cited In (2)

• Structural, Syntactic, and Statistical Pattern Recognition
• Optimal linear feature selection for a general class of statistical pattern recognition models

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