A formulation and comparison of two linear feature selection techniques applicable to statistical classification

DOI10.1016/0031-3203(84)90083-9MaRDI QIDQ761746zbMATH OpenOpenAlexFDO

Authors Dean M. Young, P. L. Odell

Publication date 1984

Published in Pattern Recognition (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0031-3203(84)90083-9

zbMATH Keywords

principal componentsdimension reductiondecompositionmisclassificationsingular valuecomparison of linear feature selection techniquesprobability ofseparability measuressmallest Bayes- classification-region-preserving dimensionWilk's method

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Monte Carlo methods (65C05)

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Cites work

• scientific article; zbMATH DE number 3136275 (Why is no real title available?)
• scientific article; zbMATH DE number 3436645 (Why is no real title available?)
• scientific article; zbMATH DE number 3097527 (Why is no real title available?)
• A model for dimension reduction in pattern recognition using continuous data
• Distance preserving linear feature selection
• Feature combinations and the bhattacharyya criterion
• Feature combinations and the divergence criterion
• Feature selection for best mean square approximation of class densities
• Linear dimension reduction and Bayes classification
• Linear dimension reduction and Bayes classification with unknown population parameters
• Linear feature selection with applications
• On minimizing the probability of misclassification for linear feature selection
• Statistical Properties of Error Estimators in Performance Assessment of Recognition Systems

Cited in

(2)

• Structural, Syntactic, and Statistical Pattern Recognition
• Optimal linear feature selection for a general class of statistical pattern recognition models

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