Test and functional diagnosis of digital devices with memory by built-in duplication

zbMATH Open0727.94012MaRDI QIDQ804547FDOQ804547

Authors: A. M. Zakaryan 

Publication date: 1990

Published in: Automation and Remote Control (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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