Stress concentration at slightly undulating surfaces

DOI10.1016/0022-5096(91)90035-MMaRDI QIDQ811155zbMATH OpenOpenAlexFDO

Authors Huajian Gao

Publication date 1991

Published in Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0022-5096(91)90035-m

zbMATH Keywords

first-order perturbation analysis

Mathematics Subject Classification ID

Stress concentrations, singularities in solid mechanics (74G70)

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Cites work

• A First-Order Perturbation Analysis of Crack Trapping by Arrays of Obstacles
• First-Order Variation in Elastic Fields Due to Variation in Location of a Planar Crack Front
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• scientific article; zbMATH DE number 877187 (Why is no real title available?)

Cited in

(18)

• Stress singularities along a cycloid rough surface
• The stress driven instability in elastic crystals: Mathematical models and physical manifestations
• Some general properties of stress-driven surface evolution in a heteroepitaxial thin film structure
• On the properties of the Eshelby tensor
• Stress effects on the performance of optical waveguides.
• A multilayer film coating with slightly curved boundary
• Stress concentration at irregular surfaces of anisotropic half-spaces
• Eigenstrains and the elastic field of an adatom
• An elastic half-plane with a fixed cycloid wavy boundary
• A film coating on a rough surface of an elastic body
• Equilibrium shapes of strained islands with non-zero contact angles
• Enhanced stability of coherently strained conical quantum dot arrays against coarsening: beyond the small slope assumption
• scientific article; zbMATH DE number 3860614 (Why is no real title available?)
• Evolution of roughness on the surface of a strained elastic material due to stress-driven surface diffusion
• Stress and Notch-Stress Concentration Induced by Slight Depressions and Protrusions
• scientific article; zbMATH DE number 1094146 (Why is no real title available?)
• Perturbation analysis of an undulating free surface in a multi-layered structure
• An energy localization principle and its application to fast kinetic Monte Carlo simulation of heteroepitaxial growth

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