Application of the HLSVD technique to the filtering of X-ray diffraction data

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Publication:836587

DOI10.1155/2007/39575zbMATH Open1168.94420arXivmath/0502539OpenAlexW2024341082WikidataQ59214846 ScholiaQ59214846MaRDI QIDQ836587FDOQ836587


Authors: M. Ladisa, A. Lamura, T. Laudadio, G. Nico Edit this on Wikidata


Publication date: 1 September 2009

Published in: EURASIP Journal on Advances in Signal Processing (Search for Journal in Brave)

Abstract: A filter based on the Hankel Lanczos Singular Value Decomposition (HLSVD) technique is presented and applied for the first time to X-ray diffraction (XRD) data. Synthetic and real powder XRD intensity profiles of nanocrystals are used to study the filter performances with different noise levels. Results show the robustness of the HLSVD filter and its capability to extract easily and efficiently the useful crystallographic information. These characteristics make the filter an interesting and user-friendly tool for processing XRD data.


Full work available at URL: https://arxiv.org/abs/math/0502539




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