Critical thickness for misfit twinning in an epilayer

DOI10.1016/J.IJSOLSTR.2008.01.018zbMATH Open1169.74481OpenAlexW2009944120MaRDI QIDQ837302FDOQ837302

Authors: Lilin Liu, Yousheng Zhang, Tong-Yi Zhang 

Publication date: 10 September 2009

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2008.01.018

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zbMATH Keywords

thin filmheteroepitaxialmisfit twinSomigliana dislocation dipole

Mathematics Subject Classification ID

Thin films (74K35)

Cited In (2)

• Effect of special rotational deformation on dislocation emission from interface collinear crack tip in nanocrystalline bi-materials
• Misfit dislocation dipoles in wire composite solids

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