Influence diagnostic in ridge semiparametric models

DOI10.1016/J.SPL.2015.06.010MaRDI QIDQ894582zbMATH OpenOpenAlexFDO

Authors Hadi Emami

Publication date 1 December 2015

Published in Statistics \& Probability Letters (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.spl.2015.06.010

zbMATH Keywords

cross-validationbandwidthridge estimatorsmoothing splinediagnostics

Mathematics Subject Classification ID

Nonparametric regression and quantile regression (62G08) Diagnostics, and linear inference and regression (62J20) Ridge regression; shrinkage estimators (Lasso) (62J07)

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Cites work

• scientific article; zbMATH DE number 3899977 (Why is no real title available?)
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• Cook's distance in local polynomial regression
• Cook's distance in spline smoothing
• Detection of Influential Observation in Linear Regression
• Difference based ridge and Liu type estimators in semiparametric regression models
• Influence diagnostics in semiparametric regression models.
• Reference values for cook's distance
• Ridge estimation of a semiparametric regression model
• Shrinkage ridge estimators in semiparametric regression models

Cited in

(15)

• Local influence in ridge semiparametric models
• Influential diagnostics with Pena’s statistic for the modified ridge regression
• Diagnostic measures for kernel ridge regression on reproducing kernel Hilbert space
• Case influence diagnostics in the lasso regression
• A two-parameter estimator in linear measurement error model
• Sensitivity analysis in semiparametric regression models
• Diagnostics for partially linear measurement error models
• Local influence for Liu estimators in semiparametric linear models
• Influence diagnostics in gamma ridge regression model
• Diagnostics for penalized least-squares estimators
• Influence diagnostics in Gamma–Pareto ridge regression model
• Influence diagnostics in semiparametric regression models.
• Influence diagnostics in ridge semi parametric linear measurement error models
• Influence Diagnostics and Outlier Tests for Semiparametric Mixed Models
• Elliptical difference based ridge and Liu type estimators in partial linear measurement error models

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