Statistical inference for competing risks model in step-stress partially accelerated life tests with progressively type-I hybrid censored Weibull life data
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Publication:896796
DOI10.1016/J.CAM.2015.11.002zbMATH Open1327.62501OpenAlexW2177452242MaRDI QIDQ896796FDOQ896796
Authors: N. E. Zubov 
Publication date: 14 December 2015
Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.cam.2015.11.002
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Cites Work
- Adaptive Rejection Sampling for Gibbs Sampling
- RETRACTED ARTICLE: Optimal planning of failure-step stress partially accelerated life tests under type-II censoring
- Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring
- Estimating the parameters of Weibull distribution and the acceleration factor from hybrid partially accelerated life test
- A tampered failure rate model for step-stress accelerated life test
- Likelihood inference for a step-stress partially accelerated life test model with Type-I progressively hybrid censored data from Weibull distribution
- Inference for accelerated competing failure models from Weibull distribution under type-I progressive hybrid censoring
- Optimum constant-stress life test plans for Pareto distribution under type-I censoring
- Estimation in step-stress partially accelerated life tests for the Burr type XII distribution using type I censoring
- Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring
- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
- Models Comparison for Step-Stress Accelerated Life Testing
Cited In (21)
- Analysis for partially accelerated dependent competing risks model with masked data based on copula function
- Inferences for Weibull-exponential distribution based on progressive type-II censoring under step-stress partially accelerated life test model
- On competing risk model under step-stress stage life testing
- Statistical inference of Type-I progressively censored step-stress accelerated life test with dependent competing risks
- Geometry of the \(q\)-exponential distribution with dependent competing risks and accelerated life testing
- The stress-strength reliability model with component strength under partially accelerated life test
- Order restricted classical and Bayesian inference of a multiple step-stress model from two-parameter Rayleigh distribution under Type I censoring
- Likelihood inference for a step-stress partially accelerated life test model with Type-I progressively hybrid censored data from Weibull distribution
- Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
- Analysis of progressive Type‐II censoring in presence of competing risk data under step stress modeling
- Statistical inference of generalized progressive hybrid censored step-stress accelerated dependent competing risks model for Marshall-Olkin bivariate Weibull distribution
- Statistical inference for the step-stress model with competing risks from the Kumaraswamy distribution under progressive type-II censoring
- Inference for accelerated competing failure models from Weibull distribution under type-I progressive hybrid censoring
- Parametric inference for progressive type-I hybrid censored data on a simple step-stress accelerated life test model
- Inference of weighted exponential distribution under progressively Type-II censored competing risks model with electrodes data
- Reliability estimation of s -out-of- k system with Kumaraswamy distribution based on partially constant stress accelerated life tests
- Geometry of an accelerated model with censored data
- Title not available (Why is that?)
- Inference on Nadarajah–Haghighi distribution with constant stress partially accelerated life tests under progressive type-II censoring
- Bayes estimation of \(P(Y < X)\) for the Weibull distribution with arbitrary parameters
- Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme
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