Ellipsoidal decision regions for motif-based patterned fabric defect detection

DOI10.1016/J.PATCOG.2009.12.001MaRDI QIDQ962807zbMATH OpenOpenAlexFDO

Authors Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung

Publication date 7 April 2010

Published in Pattern Recognition (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.patcog.2009.12.001

zbMATH Keywords

motifdefect detectionellipsoidal decision regionmax-min decision regionpatterned fabric

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Recommendations

• Motif-based defect detection for patterned fabric
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Cites work

• scientific article; zbMATH DE number 3968590 (Why is no real title available?)
• A study of Gaussian mixture models of color and texture features for image classification and segmentation
• A visual approach for driver inattention detection
• High performance computing algorithms for textile quality control
• Motif-based defect detection for patterned fabric
• The 17 plane symmetry groups

Cited in

(4)

• Analysis of planar ornament patterns via motif asymmetry assumption and local connections
• Fabric defect inspection based on isotropic lattice segmentation
• Motif-based defect detection for patterned fabric
• Clustering ellipses for anomaly detection

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