Ellipsoidal decision regions for motif-based patterned fabric defect detection

DOI10.1016/J.PATCOG.2009.12.001zbMATH Open1192.68599OpenAlexW2031577896MaRDI QIDQ962807FDOQ962807

Authors: Henry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung 

Publication date: 7 April 2010

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2009.12.001

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zbMATH Keywords

motifdefect detectionellipsoidal decision regionmax-min decision regionpatterned fabric

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites Work

• A study of Gaussian mixture models of color and texture features for image classification and segmentation
• Title not available (Why is that?)
• The 17 plane symmetry groups
• A visual approach for driver inattention detection
• High performance computing algorithms for textile quality control
• Motif-based defect detection for patterned fabric

Cited In (4)

• Analysis of planar ornament patterns via motif asymmetry assumption and local connections
• Fabric defect inspection based on isotropic lattice segmentation
• Motif-based defect detection for patterned fabric
• Clustering ellipses for anomaly detection

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