Utilizing an approximative solution to obtain the real optimal solution for a production and inspection model

DOI10.1016/J.APM.2008.12.014MaRDI QIDQ965532zbMATH OpenOpenAlexFDO

Authors Chih-Hsiung Wang, Ruey Huei Yeh

Publication date 24 April 2010

Published in Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.apm.2008.12.014

zbMATH Keywords

inspectionEMQproduction system

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Production models (90B30)

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Cites work

• Economic off-line quality control strategy with two types of inspection errors
• Economic optimization of off-line inspection with inspection errors
• Fast approach to the optimal production/PM policy
• Joint determination of production quantity, inspection schedule, and quality control for an imperfect process with deteriorating products
• Lot sizing and testing for items with uncertain quality
• Optimal Lot Sizing, Process Quality Improvement and Setup Cost Reduction
• Optimal lot size and inspection policy for products sold with warranty
• Optimal lot sizing for products sold under free-repair warranty.
• Optimal production and maintenance policy for imperfect production systems
• Optimal production run length for products sold with warranty
• Simultaneous Determination of Production Cycle and Inspection Schedules in a Production System
• Simultaneous determination of the optimal production-inventory and product inspection policies for a deteriorting production system

Cited in

(5)

• An efficient algorithm for maximizing the expected profit from a serial production line with inspection stations and rework
• The production tolerances influence on the optimal solution
• The effects of inspection delay and restoration cost on the optimal inspection and production policy
• Determining an optimal production run length with an extended quality control policy for an imperfect process
• A particle swarm algorithm for inspection optimization in serial multi-stage processes

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