RDIS: Tolerating Many Stuck-At Faults in Resistive Memory

DOI10.1109/TC.2013.2295825MaRDI QIDQ2982366zbMATH OpenOpenAlexFDO

Authors Rakan Maddah, Sangyeun Cho, Rami Melhem

Publication date 16 May 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.2013.2295825

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

Cited in

(1)

• A spline quasi-interpolation based method to obtain the reset voltage in resistive RAMs in the charge-flux domain

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