Regression model with elliptically contoured errors
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Abstract: For the regression model where the errors follow the elliptically contoured distribution (ECD), we consider the least squares (LS), restricted LS (RLS), preliminary test (PT), Stein-type shrinkage (S) and positive-rule shrinkage (PRS) estimators for the regression parameters. We compare the quadratic risks of the estimators to determine the relative dominance properties of the five estimators.
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Cites work
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- Improved estimation of mean matrix in singular elliptically contoured random samples with high-dimensional data
- A legacy in statistics: the life and contributions of Professor A. K. Md. Ehsanes Saleh
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