Reliability Analysis of Large Circuits Using Scalable Techniques and Tools

DOI10.1109/TCSI.2007.907863MaRDI QIDQ4590265zbMATH OpenOpenAlexWikidataFDO

Authors Debayan Bhaduri, Sandeep Kumar Shukla, Paul Graham, Maya B. Gokhale

Publication date 20 November 2017

Published in IEEE Transactions on Circuits and Systems I: Regular Papers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tcsi.2007.907863

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35) Fault detection; testing in circuits and networks (94C12)

Cited in

(5)

• Exact quantitative probabilistic model checking through rational search
• Computation of contact-circuit reliability
• scientific article; zbMATH DE number 7346395 (Why is no real title available?)
• Flexible reliability assessment of digital circuits based on signal probability
• Formal reliability analysis of combinational circuits using theorem proving

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