Reliability Estimates for the Truncated 2-Parameter Exponential Distribution

DOI10.1109/TR.1979.5220537MaRDI QIDQ4199405zbMATH OpenOpenAlexFDO

Authors M. A. Beg

Publication date 1979

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tr.1979.5220537

zbMATH Keywords

maximum likelihoodcomparisoncensored samplesminimum variance unbiased estimatesLehmann-Scheffe theoremsBlackwell-Rao theoremtruncated 2-parameter exponential distribution

Mathematics Subject Classification ID

Point estimation (62F10) Reliability and life testing (62N05)

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