Reliability of 3-state device systems with simultaneous failures

DOI10.1109/24.257833MaRDI QIDQ4285217zbMATH OpenOpenAlexFDO

Authors Naoto Satoh, Masafumi Sasaki, Tetushi Yuge, Shigeru Nanagi

Publication date 13 March 1994

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/24.257833

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Cited in

(5)

• Compound Poisson approximation: A user's guide
• Start-up demonstration tests: models, methods and applications, with some unifications
• Dynamic directed evidential networks with conditional belief functions: application to system reliability
• Asymptotic property of a reparable multi-state device
• A lower bound for the reliability function of multiple failure mode systems

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