Reliability of compact testing methods

MaRDI QIDQ1813530zbMATH OpenFDO

Authors E. P. Kalosha, E. I. Katsnel'son, Vyacheslav Yarmolik

Publication date 25 June 1992

Published in Automation and Remote Control (Search for Journal in Brave)

zbMATH Keywords

compact testing methodsefficiencyreliability criteriatested digital device

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)

Review text

Methods of evaluation of reliability of compact testing methods that result from neglecting the properties of the tested digital device have already been studied. In this paper, an improved method which takes into account the properties of the tested digital devices and uses the probabilities of failing to detect errors of a given multiplicity is investigated to compare the efficiency of different compact testing methods.

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Cited in

(3)

• Estimation of the test completeness of devices with analog controllable parameters
• A New Approach to the Evaluation of the Reliability of Digital Systems
• Relative test elements for tight closure

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