imaging of nanostructures
| research problem |
Available identifiers
mathematical model for transmission electron microscopy of nanostructures
We present a mathematical model and a tool chain for the numerical simulation of transmission electron microscopy (TEM) images of semiconductor quantum dots (QDs). This includes elasticity theory to obtain the strain profile coupled with the Darwin–Howie–Whelan equations, describing the propagation of the electron wave through the sample. This tool chain can be applied to generate a database of simulated transmission electron microscopy (TEM) images, which is a key element of a novel concept for model-based geometry reconstruction of semiconductor QDs, involving machine learning techniques.
List of models for this research problem
| dynamical electron scattering model |
Described at:
| Numerical simulation of TEM images for In(Ga)As/GaAs quantum dots with various shapes |
Related URL
https://www.wikidata.org/wiki/Q110779037
http://en.wikipedia.org/wiki/Transmission_electron_microscopy
Further items linking to imaging of nanostructures
| Item | Property |
|---|---|
| transmission electron microscopy | contains |
This page was built for research problem: imaging of nanostructures
