Root cause analysis of manufacturing variation from optical scanning data
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Cites work
- A Factor-Analysis Method for Diagnosing Variability in Mulitvariate Manufacturing Processes
- A Monitoring and Diagnostic Approach for Stochastic Textured Surfaces
- A distance-based control chart for monitoring multivariate processes using support vector machines
- An exploratory analysis approach for understanding variation in stochastic textured surfaces
- Analyzing Nonparametric Part-to-Part Variation in Surface Point Cloud Data
- Bayesian sequential update for monitoring and control of high-dimensional processes
- Deep learning
- Diagnosing manufacturing variation using second-order and fourth-order statistics
- Economic design under gamma shock model of the control chart for sustainable operations
- Independent component analysis: a statistical perspective
- LASSO-based multivariate linear profile monitoring
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