Self-dual self-testing multicycle circuits: Their properties

DOI10.1023/A:1010245914985MaRDI QIDQ1778424zbMATH OpenOpenAlexFDO

Authors M. Gessel', A. V. Dmitriev, V. V. Sapozhnikov, Vl. V. Sapozhnikov

Publication date 17 June 2005

Published in Automation and Remote Control (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1023/a:1010245914985

zbMATH Keywords

MCNC benchmark circuitsmemory circuitsself-dual functions

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

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