Sensitivity analysis of a reliability growth model

DOI10.1016/S0362-546X(97)00236-8MaRDI QIDQ4374189zbMATH OpenOpenAlexFDO

Authors Dennis C. Koutras, A. N. V. Rao

Publication date 1997

Published in Nonlinear Analysis: Theory, Methods & Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s0362-546x(97)00236-8

Mathematics Subject Classification ID

Applications of renewal theory (reliability, demand theory, etc.) (60K10) Applications of statistics in engineering and industry; control charts (62P30)

Cites work

• A Quasi-Bayes Estimate of the Failure Intensity of a Reliability-Growth Model
• Some Results on Inference for the Weibull Process

Cited in

(3)

• Sensitivity analysis in optimal software release time problems.
• Bayesian inference and prediction analysis of the power law process based on a gamma prior distribution
• Bayesian inference and prediction analysis of the power law process based on a natural conjugate prior

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