Optimal simple step stress accelerated life test design for reliability prediction (Q1007446)

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Optimal simple step stress accelerated life test design for reliability prediction
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    Optimal simple step stress accelerated life test design for reliability prediction (English)
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    20 March 2009
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    step stress accelerated life testing
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    Weibull
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    failure data
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    censoring
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    reliability
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    hold time
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