Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (Q1939763)

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Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films
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    Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films (English)
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    5 March 2013
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    electromechanics
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    dielectric
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    diffusion
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    vacancies
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    thin films
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