Frequency Domain Estimation of Integrated Volatility for Itô Processes in the Presence of Market-Microstructure Noise (Q3567037)

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Frequency Domain Estimation of Integrated Volatility for Itô Processes in the Presence of Market-Microstructure Noise
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    Frequency Domain Estimation of Integrated Volatility for Itô Processes in the Presence of Market-Microstructure Noise (English)
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    10 June 2010
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    bias correction
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    market microstructure noise
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    realized volatility
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    multiscale inference
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    Whittle likelihood
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