Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis (Q442005)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis |
scientific article; zbMATH DE number 6064382
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis |
scientific article; zbMATH DE number 6064382 |
Statements
Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis (English)
0 references
8 August 2012
0 references
buckle-driven delamination
0 references
release-and-Bond-back
0 references
thin films
0 references
micro/nano-fluidic channels
0 references
finite element analysis
0 references
0.8428119
0 references
0.8403933
0 references
0.8391706
0 references
0.82787305
0 references
0.8235533
0 references
0.8205602
0 references
0.8203563
0 references
0.81639445
0 references
0.81635725
0 references