Study of a Markov model for a high-quality dependent process

DOI10.1080/02664760050003641MaRDI QIDQ4493500zbMATH OpenOpenAlexFDO

Authors Chin-Diew Lai, Min Xie, K. Govindaraju

Publication date 6 August 2000

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664760050003641

zbMATH Keywords

ARLaverage run lengthserial correlationserial dependence

Mathematics Subject Classification ID

Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Applications of statistics in engineering and industry; control charts (62P30)

Recommendations

• Single attribute control charts for a Markovian-dependent process
• Continuous single attribute control chart for Markov-dependent processes
• Extending a double sampling control chart for non-conforming proportion in high quality processes to the case of small samples
• On Cumulative Conforming Type of Control Charts for High Quality Processes Under Sampling Inspection
• Modified synthetic control chart for one-step Markov-dependent processes

Cites work

• Analysis of Autocorrelations in Dynamic Processes
• Continuous sampling plans for markov-dependent production processes
• Number of successes in Markov trials
• Probability Limits on Outgoing Quality for Continuous Sampling Plans
• Run-Length Distributions of Special-Cause Control Charts for Correlated Processes

Cited in

(8)

• Estimation of the limiting availability of a repairable series system with stationary dependent sequences
• Single attribute control charts for a Markovian-dependent process
• On the estimation of serial correlation in Markov-dependent production processes
• scientific article; zbMATH DE number 943730 (Why is no real title available?)
• Continuous single attribute control chart for Markov-dependent processes
• Modified synthetic control chart for one-step Markov-dependent processes
• The statistical design of CCC-r chart with runs rules for a high-yield dependent process
• On the monitoring of multi-attributes high-quality production processes

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